April 3, 2009 -
SNIA has published
a new white paper -
“NAND
Flash Solid State Storage for the Enterprise - an in-depth Look at Reliability.”
(pdf)
It's co-authored by:- Jonathan Thatcher Fusion-io, Tom Coughlin Coughlin Associates, Jim Handy Objective Analysis and Neal Ekker Texas Memory Systems.
The article contains the best integrated explanation I've seen of the design trade-offs for error correction schemes and how they affect bit error rates compared to the raw uncorrected results. It goes on to explain the importance of the SSD controller and memory architecture (dispersing data among many chips) and how these can improve data integrity by managing read disturb errors. It also discusses wear-leveling and write amplification which have been well covered elsewhere. ...read the article
It's co-authored by:- Jonathan Thatcher Fusion-io, Tom Coughlin Coughlin Associates, Jim Handy Objective Analysis and Neal Ekker Texas Memory Systems.
The article contains the best integrated explanation I've seen of the design trade-offs for error correction schemes and how they affect bit error rates compared to the raw uncorrected results. It goes on to explain the importance of the SSD controller and memory architecture (dispersing data among many chips) and how these can improve data integrity by managing read disturb errors. It also discusses wear-leveling and write amplification which have been well covered elsewhere. ...read the article
SSSI_NAND_Flash_White_Paper.pdf